TY - GEN
AU - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems 29. 2016 Storrs, Conn
AU - Institute of Electrical and Electronics Engineers
AU - IEEE Computer Society
AU - IEEE Computer Society Test Technology Technical Council
AU - IEEE Computer Society Technical Committee on Dependable Computing and Fault Tolerance
TI - 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) September 19-20, 2016, University of Connecticut, Storrs, CT USA
PB - IEEE
SN - 1509036237
SN - 9781509036233
KW - Integrated circuits Fault tolerance Congresses
KW - Integrated circuits Very large scale integration Congresses
KW - Nanotechnology Congresses
KW - Konferenzschrift
KW - VLSI
KW - Fehlertoleranz
PY - 2016
N2 - Literaturangaben
N2 - Enthält Beiträge der zwei Special Sessions "Special Session on Fault-tolerant Realtime Systems" und "Special Session on the use of VLSI Techniques for Securing ICs against Attacks"
CY - Piscataway, NJ
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
Download citation