TY - GEN
AU - Anjum, Taseer
AU - Gutt, Christian
TI - Nanomechanics: Mechanical response analysis of semiconductor GaAs nanowires by using finite element method and x-ray diffraction techniques
PB - Universitätsbibliothek der Universität Siegen
KW - Diffraction
KW - Nanowires
KW - Finite element method
KW - Nanodraht
KW - Semiconductor nanowires
KW - Manomechanical properties
KW - X-ray diffraction
KW - Gorsky effect
KW - Three point bending test
PY - 2021
CY - Siegen
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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