TY - GEN
AU - Klein, Robert
AU - Steiner, Matthew
AU - Suhring, William
AU - Agnew, Sean
AU - Fitz-Gerald, James
TI - Constructing portable depth from defocus optical profilometers for surface roughness evaluation
PB - IOP Publishing
SN - 2051-672X
KW - Materials Chemistry
KW - Surfaces, Coatings and Films
KW - Process Chemistry and Technology
KW - Instrumentation
PY - 2015
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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