TY - GEN
AU - Sio, Hang Cheong
AU - Phang, Sieu Pheng
AU - Macdonald, Daniel
TI - Imaging Surface Recombination Velocities of Grain Boundaries in Multicrystalline Silicon Wafers via Photoluminescence
PB - Wiley
SN - 2367-198X
KW - Electrical and Electronic Engineering
KW - Energy Engineering and Power Technology
KW - Atomic and Molecular Physics, and Optics
KW - Electronic, Optical and Magnetic Materials
PY - 2017
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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