TY - GEN
AU - Zier, Michael
AU - Oswald, Steffen
AU - Reiche, Rainer
AU - Wetzig, Klaus
TI - Non-destructive depth profile analysis using synchrotron radiation excited XPS
PB - Springer Science and Business Media LLC
SN - 1436-5073
SN - 0026-3672
PY - 2006
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
Download citation