TY - GEN
AU - Misawa, Guento
AU - Yamada, Hirofumi
AU - Yutaka Seino, Yutaka Seino
AU - Kan Nakayama, Kan Nakayama
TI - Atomic Force Microscopy of Cracks on Si(100) and GaAs(100) Caused by Vickers Indenter
PB - IOP Publishing
SN - 1347-4065
SN - 0021-4922
KW - General Physics and Astronomy
KW - General Engineering
PY - 1996
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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