TY - GEN
AU - Zheng, Nan
AU - Mazumder, Pinaki
TI - Modeling and Mitigation of Static Noise Margin Variation in Subthreshold SRAM Cells
PB - Institute of Electrical and Electronics Engineers (IEEE)
SN - 1549-8328
SN - 1558-0806
PY - 2017
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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