TY - GEN
AU - Lal, Deeksha
AU - Ali, Ahmed M. A.
AU - Ricketts, David S.
TI - Analysis and Comparison of High-Resolution GS/s Samplers in Advanced BiCMOS and CMOS
PB - Institute of Electrical and Electronics Engineers (IEEE)
SN - 1558-3791
SN - 1549-7747
KW - Electrical and Electronic Engineering
PY - 2018
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
Download citation