TY - GEN
AU - Preuss, Alan
AU - Fietz, Walter H.
AU - Immel, Fabian
AU - Kauffmann-Weiss, Sandra
AU - Wolf, Michael J.
TI - Critical Current Degradation of Coated Conductors Under Soldering Conditions
PB - Institute of Electrical and Electronics Engineers (IEEE)
SN - 1051-8223
SN - 1558-2515
KW - Electrical and Electronic Engineering
KW - Condensed Matter Physics
KW - Electronic, Optical and Magnetic Materials
PY - 2018
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
Download citation