TY - GEN
AU - Liu, AnYao
AU - Walter, Daniel
AU - Phang, Sieu Pheng
AU - Macdonald, Daniel
TI - Investigating Internal Gettering of Iron at Grain Boundaries in Multicrystalline Silicon via Photoluminescence Imaging
PB - Institute of Electrical and Electronics Engineers (IEEE)
SN - 2156-3403
SN - 2156-3381
KW - Electrical and Electronic Engineering
KW - Condensed Matter Physics
KW - Electronic, Optical and Magnetic Materials
PY - 2012
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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