TY - GEN
AU - Hallam, Brett J.
AU - Abbott, Malcolm D.
AU - Nampalli, Nitin
AU - Hamer, Phill G.
AU - Wenham, Stuart R.
TI - Implications of Accelerated Recombination-Active Defect Complex Formation for Mitigating Carrier-Induced Degradation in Silicon
PB - Institute of Electrical and Electronics Engineers (IEEE)
SN - 2156-3381
SN - 2156-3403
KW - Electrical and Electronic Engineering
KW - Condensed Matter Physics
KW - Electronic, Optical and Magnetic Materials
PY - 2016
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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