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  1. Basu, Mitra [Editor]

    Data complexity in pattern recognition

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    London: Springer, 2006

    Published in: Advanced information and knowledge processing

  2. Eye, Alexander von [Author]; Wiedermann, Wolfgang [Author]

    The general linear model : a primer

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    Cambridge, United Kingdom; New York, NY: Cambridge University Press, 2023

  3. Vielhauer, Claus [Editor] ; COST 2101 European Workshop BioID 2011 Brandenburg an der Havel

    Biometrics and ID management : COST 2101 European workshop, BioID 2011, Brandenburg (Havel), Germany, March 8 - 10, 2011 ; [Third European Workshop on Biometrics and Identity Management] ; proceedings

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    Berlin; Heidelberg [u.a.]: Springer, 2011

    Published in: Lecture notes in computer science ; 6583

  4. Quiñonero-Candela, Joaquin [Editor]; Dagan, Ido [Other]; Magnini, Bernardo [Other]; D'Alché-Buc, Florence [Other] ; PASCAL Machine Learning Challenges Workshop 1 2005 Southampton

    Machine learning challenges : evaluating predictive uncertainty, visual object classification and recognizing textual entailment ; first PASCAL Machine Learning Challenges Workshop, MLCW 2005, Southampton, UK, April 11 - 13, 2005 ; revised selected papers

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    Berlin; Heidelberg [u.a.]: Springer, 2006

    Published in: Lecture notes in computer science ; 3944