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  1. Jacob, Rainer [Author] ; Helm, Manfred [Degree supervisor]; Eng, Lukas [Degree supervisor]

    Scanning near-field infrared microspectroscopy on semiconductor structures

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    Dresden: Saechsische Landesbibliothek- Staats- und Universitaetsbibliothek Dresden; Dresden: Technische Universität Dresden; Dresden: Helmholtz-Zentrum Dresden-Rossendorf, 2011

  2. Halbich, Marc-Uwe [Author]; Schmidt, Jan [Author]

    Extraction of PEDOT:PSS/c-Si Junction Properties by Modeling of Injection-Dependent Lifetime Measurements Including Depletion Region Modulation - [published Version]

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    Weinheim : Wiley-VCH, 2021

    Published in: Physica Status Solidi - Rapid Research Letters 15 (2021), Nr. 4 ; Physica Status Solidi - Rapid Research Letters

  3. Keyser, U.F. [Author]; Fühner, C. [Author]; Borck, S. [Author]; Haug, Rolf J. [Author]; Bichler, M. [Author]; Abstreiter, G. [Author]; Wegscheider, W. [Author]

    Kondo effect in a few-electron quantum ring - [published Version]

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    College Park, MD : American Physical Society, 2003

    Published in: Physical Review Letters 90 (2003), Nr. 19

  4. DIN-Normenausschuss Materialprüfung (NMP), Materials Testing Standards Committee, DIN Deutsches Institut für Normung e. V., DIN German Institute for Standardization

    DIN EN ISO 9934-2 : Zerstörungsfreie Prüfung - Magnetpulverprüfung - Teil 2: Prüfmittel (ISO 9934-2:2015); Deutsche Fassung EN ISO 9934-2:2015 - [2015-12-00]

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    Berlin, Wien, Zürich: Beuth Verlag, 2015

    Published in: DIN-Regelwerk- Deutsche Normen

  5. ISO/TC 135 Zerstörungsfreie Prüfungen, ISO/TC 135 Non-destructive testing, ISO/TC 135 Essais non destructifs, ISO Internationale Organisation für Normung, ISO International Organization for Standardization, ISO Organisation Internationale de Normalisation

    ISO 9934-2 : Non-destructive testing - Magnetic particle testing - Part 2: Detection media - [2015-09-00]

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    Geneve: International Organization for Standardization, 2015

    Published in: ISO-Regelwerk- ISO-Normen