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Inst., 2006
Published in:Physical review / C 74, 055201 (2006). doi:10.1103/PhysRevC.74.055201
Ahrens, J.
[Author];
Alexeev, V. M.
[Author];
Giller, I.
[Author];
Grabmayr, P.
[Author];
Hehl, T.
[Author];
Hornidge, D.
[Author];
Kashevarov, V. L.
[Author];
Kotulla, M.
[Author];
Krambrich, D.
[Author];
Krusche, B.
[Author];
Lang, M.
[Author];
MacGeorge, J. C.
[Author];
Annand, J. R. M.
[Author];
MacGregor, I. J. D.
[Author];
Metag, V.
[Author];
Moinester, M.
[Author];
Novotny, R.
[Author];
Pfeiffer, M.
[Author];
Rost, M.
[Author];
Schadmand, S.
[Author];
Scherer, S.
[Author];
Thomas, A.
[Author];
Unkmeir, C.
[Author];
Arends, H. J.
[Author];
[...]
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Springer, 2005
Published in:The European physical journal / A 23, 113 (2005). doi:10.1140/epja/i2004-10056-2
DKE Deutsche Kommission Elektrotechnik Elektronik Informationstechnik in DIN und VDE,
German Commission for Electrical, Electronic and Information Technologies of DIN and VDE,
DIN Deutsches Institut für Normung e. V.,
DIN German Institute for Standardization