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  1. Henninges, Heiner [Author]

    Scannen : Technik und Praxis - [2. Dr.]

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    Haar bei München: Markt-&-Technik, Buch- und Software-Verl., 1994

  2. Baeseler, Frank [Author]; Bovill, Bruce [Author]

    Das Scanner-Handbuch

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    Hamburg [u.a.]: McGraw-Hill, 1990

  3. Katys, Georgij Petrovič [Author]

    Avtomatičeskoe skanirovanie

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    Moskva: Izd. "Mašinostroenie", 1969

  4. Hearle, John W. S. [Author]; Sparrow, John T. [Author]; Cross, Patricia M. [Author] ; Hearle, John William Stanley [Other]; Sparrow, John Templeton [Other]; Cross, Patricia Margaret [Other]

    The use of the scanning electron microscope - [1. ed.]

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    Oxford [u.a.]: Pergamon Press, 1972

  5. Bhushan, Bharat [Editor]

    Applied scanning probe methods

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    Berlin; Heidelberg [u.a.]: Springer, 2004-2009

    Published in: NanoScience and technology

  6. Meyer, Ernst [Author]; Hug, Hans Josef [Author]; Bennewitz, Roland [Author]

    Scanning probe microscopy : the lab on a tip

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    Berlin; Heidelberg [u.a.]: Springer, 2004

    Published in: Advanced texts in physics- Physics and astronomy online library