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  1. Stockmann, Helena; Enghard, Philipp; Lehner, Lukas Johannes

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    Ovid Technologies (Wolters Kluwer Health), 2022

    Published in: Critical Care Medicine

  2. Dobusch, Leonhard; Lehner, Lukas; Mager, Astrid; Wöhl, Stefanie

    Editorial der HerausgeberInnen

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    Universitaet Innsbruck - Innsbruck University Press, 2021

    Published in: Momentum Quarterly - Zeitschrift für sozialen Fortschritt

  3. Dobusch, Leonhard; Lehner, Lukas; Mager, Astrid; Tammesberger, Dennis; Wöhl, Stefanie

    Editorial der HerausgeberInnen

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    Universitaet Innsbruck - Innsbruck University Press, 2020

    Published in: Momentum Quarterly - Zeitschrift für sozialen Fortschritt

  4. Martin, Andreas; Berger, Johannes; Kamp, Angelika; Valdman, Lukas; Lehner, Anja; Mykytenko, Sergii; Nielen, Heiko

    Plasma Induced Charging Damage Causing MOS Device Reliability Lifetime Degradation Originating From Well Charging of a Technology With Deep Trench Isolation

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    Institute of Electrical and Electronics Engineers (IEEE), 2023

    Published in: IEEE Transactions on Device and Materials Reliability