Skip to contents Mach, Thomas [Author] ; Benner, Peter [Degree supervisor]; Börm, Steffen [Other] Eigenvalue Algorithms for Symmetric Hierarchical Matrices Books View online Schließen > Access https://d-nb.info/1214243436/34 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Chemnitz: Universitätsbibliothek Chemnitz, 2012 Ross, Alasdair I.; Schenk, Thomas; Hesse, Constanze Line-bisectioning and obstacle avoidance: Evidence for separate strategies Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Elsevier BV, 2014 Published in: Acta Psychologica Saab, Y.G.; Rao, V.B. Fast effective heuristics for the graph bisectioning problem Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Institute of Electrical and Electronics Engineers (IEEE), 1990 Published in: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Mach, Thomas [Author] ; Benner, Peter [Degree supervisor]; Börm, Steffen [Other] Eigenvalue Algorithms for Symmetric Hierarchical Matrices Books View online Schließen > Access https://d-nb.info/1214243436/34 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Chemnitz: Universitätsbibliothek Chemnitz, 2012
Ross, Alasdair I.; Schenk, Thomas; Hesse, Constanze Line-bisectioning and obstacle avoidance: Evidence for separate strategies Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Elsevier BV, 2014 Published in: Acta Psychologica
Saab, Y.G.; Rao, V.B. Fast effective heuristics for the graph bisectioning problem Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Institute of Electrical and Electronics Engineers (IEEE), 1990 Published in: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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