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  1. Lin, Qinghuang; Simpson, Logan L.; Steinhaeusler, Thomas; Wilder, Michelle; Willson, C. Grant; Havard, Jennifer M.; Frechet, Jean M. J.

    Water-soluble resist for environmentally friendly lithography

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    SPIE, 1996

    Published in: Metrology, Inspection, and Process Control for Microlithography X

  2. Lin, Qinghuang; Black, Charles T.; Detavernier, Christophe; Gignac, Lynne; Guarini, Kathryn; Herbst, Brian; Kim, Hyungjun; Oldiges, Philip; Petrillo, Karen E.; Sanchez, Martha I.

    Does line-edge roughness matter?: FEOL and BEOL perspectives

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    SPIE, 2003

    Published in: Advances in Resist Technology and Processing XX

  3. Wang, Chao; Nam, Sung-Wook; Cotte, John M.; Jahnes, Christopher V.; Colgan, Evan G.; Bruce, Robert L.; Brink, Markus; Lofaro, Michael F.; Patel, Jyotica V.; Gignac, Lynne M.; Joseph, Eric A.; Rao, Satyavolu Papa; Stolovitzky, Gustavo; Polonsky, Stanislav; Lin, Qinghuang

    Wafer-scale integration of sacrificial nanofluidic chips for detecting and manipulating single DNA molecules

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    Springer Science and Business Media LLC, 2017

    Published in: Nature Communications

  4. Wang, Chao; Bruce, Robert L.; Duch, Elizabeth A.; Patel, Jyotica V.; Smith, Joshua T.; Astier, Yann; Wunsch, Benjamin H.; Meshram, Siddharth; Galan, Armand; Scerbo, Chris; Pereira, Michael A.; Wang, Deqiang; Colgan, Evan G.; Lin, Qinghuang; Stolovitzky, Gustavo

    Hydrodynamics of Diamond-Shaped Gradient Nanopillar Arrays for Effective DNA Translocation into Nanochannels

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    American Chemical Society (ACS), 2015

    Published in: ACS Nano

  5. Lin, Qinghuang; Nelson, A.; Bozano, L.; Brock, P.; Cohen, S.; Davis, B.; Kwong, R.; Liniger, E.; Neumayer, D.; Rathore, J. S.; Shobha, H.; Sooriyakumaran, R.; Purushothaman, S.; Miller, R.; Allen, R.; Spooner, T.; Wisnieff, R.

    Extending photo-patternable low-κ concept to 193nm lithography and e-beam lithography

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    SPIE, 2011

    Published in: SPIE Proceedings

  6. Lin, Qinghuang; Nelson, Alshakim; Chen, Shyng-Tsong; Brock, Philip; Cohen, Stephan A.; Davis, Blake; Kaplan, Richard; Kwong, Ranee; Liniger, Eric; Neumayer, Debra; Patel, Jyotica; Shobha, Hosadurga; Sooriyakumaran, Ratnam; Purushothaman, Sampath; Miller, Robert; Spooner, Terry; Wisnieff, Robert

    Integration of Photo-Patternable Low-κ Material into Advanced Cu Back-End-Of-The-Line

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    IOP Publishing, 2010

    Published in: Japanese Journal of Applied Physics

  7. Lin, Qinghuang; Chen, S. T.; Nelson, A.; Brock, P.; Cohen, S.; Davis, B.; Fuller, N.; Kaplan, R.; Kwong, R.; Liniger, E.; Neumayer, D.; Patel, J.; Shobha, H.; Sooriyakumaran, R.; Purushothaman, S.; Spooner, T.; Miller, R.; Allen, R.; Wisnieff, R.

    Multilevel integration of patternable low-κ material into advanced Cu BEOL

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    SPIE, 2010

    Published in: SPIE Proceedings

  8. Huang, Wu-Song; Kwong, Ranee W.; Moreau, Wayne M.; Lang, Robert; Medeiros, David R.; Petrillo, Karen E.; Mahorowala, Arpan P.; Angelopoulos, Marie; Lin, Qinghuang; Dai, Junyan; Ober, Christopher K.

    Applicaton of blends and side chain Si-O copolymers as high-etch-resistant sub-100-nm e-beam resists

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    SPIE, 2002

    Published in: SPIE Proceedings