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  1. Rajsuman, Rochit [Other] ; IEEE International Workshop on Memory Technology, Design, and Testing (1994 :San Jose, Calif.), IEEE Computer Society Test Technology Technical Committee, IEEE Computer Society Technical Committee on VLSI

    Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California

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    Los Alamitos, Calif: IEEE Computer Society Press, 2011 ; [S.l.]: HathiTrust Digital Library

  2. Institute of Electrical and Electronics Engineers, Institute of Electrical and Electronics Engineers Taipei Section, Qinghua-Daxue Taipeh, IEEE Computer Society Test Technology Technical Council

    IEEE International Workshop on Memory Technology, Design, and Testing 2009, MTDT 2009 : Aug. 31 - Sept. 2, 2009, Hsinchu, Taiwan

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    Piscataway, NJ: IEEE Service Center, 2009

  3. Institute of Electrical and Electronics Engineers, IEEE Computer Society, IEEE Computer Society Test Technology Technical Council

    IEEE International Workshop on Memory Technology, Design and Testing, 2007 : MTDT 2007 ; 3 - 5 Dec. 2007, Taipei, Taiwan

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    Piscataway, NJ: IEEE, 2007

  4. IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Technical Committee on VLSI, Qinghua-Daxue Taipeh

    IEEE International Workshop on Memory Technology, Design, and Testing, 2006 : MTDT '06 ; 2 - 4 Aug. 2006, Taipei, Taiwan ; proceedings

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    Piscataway, NJ: IEEE, 2006

  5. IEEE International Workshop on Memory Technology, Design, and Testing (13th :2005 :Taipei, Taiwan), Guo li qing hua da xue (Hsinchu, Taiwan), IEEE Computer Society Technical Council on Test Technology

    2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan

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    Los Alamitos, Calif: IEEE Computer Society, 2005

  6. Rajsuman, Rochit [Other]; Wik, Thomas [Other] ; IEEE International Workshop on Memory Technology, Design, and Testing (12th :2004 :San Jose, Calif.), IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology, IEEE Solid-State Circuits Society

    MTDT 2004 : records of the 2004 International Workshop on Memory Technology, Design and Testing : 9-10 August, 2004, San Jose, California, USA

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    Los Alamitos, Calif: IEEE Computer Society, 2004

  7. Singh, Adit [Other]; Rajsuman, Rochit [Other]; Wit, Tom [Other] ; IEEE International Workshop on Memory Technology, Design, and Testing (11th :2003 :San Jose, Calif.), IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology, IEEE Solid-State Circuits Society

    Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing, 28-29 July, 2003, San Jose, California

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    Los Alamitos, Calif: IEEE Computer Society, 2003

  8. Courtois, Bernard [Other]; Wik, Thomas [Other]; Zorian, Yervant [Other] ; IEEE International Workshop on Memory Technology, Design, and Testing (2002 :Isle of Bendor, France), IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology, IEEE Solid-State Circuits Council

    Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France

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    [Piscataway, N.J.]: IEEE, 2002

  9. Lombardi, Fabrizio [Other]; Rajsuman, Rochit [Other]; Wik, Thomas [Other] ; IEEE International Workshop on Memory Technology, Design, and Testing (1997 :San Jose, Calif.), IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Test Technology Technical Committee, IEEE Solid-State Circuits Council

    International Workshop on Memory Technology, Design and Testing : proceedings

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    [Piscataway, N.J.]: IEEE, 2001

  10. Rajsuman, Rochit [Other]; Wik, Thomas [Other] ; IEEE International Workshop on Memory Technology, Design, and Testing (1999 :San Jose, Calif.), IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology, IEEE Solid-State Circuits Council

    Records of the 1999 IEEE International Workshop on Memory Technology, Design and Testing : August 9-10, 1999, San Jose, California, USA

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    [Piscataway, N.J.]: IEEE, 2001

  11. Rajsuman, Rochit [Other]; Wik, Thomas [Other] ; IEEE International Workshop on Memory Technology, Design, and Testing (8th :2000 :San Jose, Calif.), IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology, IEEE Solid-State Circuits Society

    Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing : August 7-8, 2000, San Jose, California

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    Los Alamitos, Calif: IEEE Computer Society, 2000

  12. Rajkanan, Kamal [Other]; Rajsuman, Rochit [Other] ; IEEE International Workshop on Memory Technology, Design, and Testing (1995 :San Jose, Calif.), IEEE Computer Society Test Technology Technical Committee, IEEE Computer Society Technical Committee on VLSI, IEEE Solid-State Circuits Council

    Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California

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    Los Alamitos, Calif: IEEE Computer Society Press, 1995

  13. Rajsuman, Rochit [Other] ; IEEE International Workshop on Memory Testing (1993 :San Jose, Calif.), IEEE Computer Society Test Technology Technical Committee

    Records of the 1993 IEEE International Workshop on Memory Testing, August 9-10, 1993, San Jose, California

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    Los Alamitos, Calif: IEEE Computer Society Press, 1993

  14. Shi, Lu-Ping [Organizer]; Wang, Kang L. [Organizer] ; Non-Volatile Memory Technology Symposium 15. 2015 Peking

    2015 15th Non-Volatile Memory Technology Symposium (NVMTS) : October 12 to 14, 2015, Tsinghua University, Beijing, China

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    [Piscataway, NJ]: IEEE, 2015