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  1. Remond, G. [Editor] ; Scanning Microscopy International Chicago, Ill, Pfefferkorn Conference 11 1992 Amherst, Mass

    Physics of generation and detection of signals used for microcharacterization : proceedings of the 11th Pfefferkorn Conference, held August 9 to 14, 1992 at Univ. Massachusetts, Amherst

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    AMF O'Hare, Ill.: Scanning Microscopy International, 1993

    Published in: Scanning microscopy ; 7

  2. Scanning : a journal of scanning microscopies

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    Hoboken, NJ: Wiley, 1978-2012 ; New York, NY; Baden-Baden: Witzstrock, 1978-1981 ; Mahwah, NJ: FACM Publ., teils ; Mahwah, NJ: FAMS, -2006,5 / 1.1978 - 4.1981; 5.1983 - 34.2012

  3. Wells, Oliver C. [Author] ; Boyde, Alan [Other]; Lifshin, Eric [Other]; Rezanowich, Alex [Other]

    Scanning electron microscopy

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    New York, NY [u.a.]: McGraw-Hill, 1974

  4. Reimer, Ludwig [Author]; Pfefferkorn, Gerhard [Author]

    Raster-Elektronenmikroskopie

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    Berlin; Heidelberg [u.a.]: Springer, 1973