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  1. Jia, C. L. [Author]; Rodriguez-Contreras, J. [Author]; Poppe, T. D. [Author]; Kohlstedt, H. [Author]; Waser, R. [Author]; Urban, K. [Author]

    Lattice strain and lattice expansion of the SrRuO3 layers in SrRuO3/PbTr0.52Ti0.48O3/SrRuO3 multilayers thin films

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    American Institute of Physics, 2002

    Published in: Journal of applied physics 92, 101 (2002).

  2. He, J. Q. [Author]; Jia, C. L. [Author]; Vaithyanathan, V. [Author]; Schlom, D. G. [Author]; Schubert, J. [Author]; Gerber, A. [Author]; Kohlstedt, H. H. [Author]; Wang, R. H. [Author]

    Interfacial reaction in the growth of epitaxial SrTiO3 thin films on (001) Si substrates

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    American Institute of Physics, 2005

    Published in: Journal of applied physics 97, 104921 (2005). doi:10.1063/1.1915519

  3. Setter, N. [Author]; Damjanovic, D. [Author]; Stolichnov, I. [Author]; Tagantsev, A. K. [Author]; Taylor, D. V. [Author]; Yamada, Y. [Author]; Streiffer, S. [Author]; Eng, L. [Author]; Fox, G. [Author]; Gevorgian, S. [Author]; Hong, S. [Author]; Kingon, A. [Author]; Kohlstedt, H. [Author]; Park, N. Y. [Author]; Stephenson, G. B. [Author]

    Ferroelectric thin films: Review of materials, properties and applications

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    American Institute of Physics, 2006

    Published in: Journal of applied physics 100, 051606 (2006). doi:10.1063/1.2336999

  4. Alam, M. [Contributor]; Argon, A. S. [Contributor]; Bell, J. P. [Contributor]; Berg, S. [Contributor]; Berndt, C. C. [Contributor]; Botticelli, V. [Contributor]; Bouzziri, M. [Contributor]; Boyce, M. C. [Contributor]; Brown, Sherman D. [Contributor]; Buchwalter, L. P. [Contributor]; Cho, Y. R. [Contributor]; Collins, C. B. [Contributor]; Dale, William C. [Contributor]; Davanloo, F. [Contributor]; Dillard, David A. [Contributor]; Dole, P. [Contributor]; Edwards, R. A. [Contributor]; Farris, R. J. [Contributor]; Feger, C. [Contributor]; Freeman, D. R. [Contributor]; Fromm, E. [Contributor]; Frushour, Bruce G. [Contributor]; Galipeau, D. W. [Contributor]; Gerberich, W. W. [Contributor]; [...]

    Adhesion Measurement of Films and Coatings : Proceedings of the International Symposium on Adhesion Measurement of Films and Coatings held in Boston, 5–7 December 1992, under the auspices of Skill Dynamics. - - [Reprint 2020]

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    Berlin; Boston: De Gruyter, 2022

  5. Achar, B. N. N [Contributor]; Acharya, H. N [Contributor]; Adirovich, E. I [Contributor]; Adrianovskii, B. P [Contributor]; Albrecht, H. E [Contributor]; Arijs, E [Contributor]; Balchin, A. A [Contributor]; Barsch, G. R [Contributor]; Beyer, P [Contributor]; Bidjin, D [Contributor]; Birnbaum, H. K [Contributor]; Bose, H. N [Contributor]; Cadek, J [Contributor]; Celustka, B [Contributor]; Cingolani, A [Contributor]; Coufal, H. J [Contributor]; Crandell, M. E [Contributor]; Cuciureanu, E [Contributor]; Demko, J [Contributor]; Dziuba, E. Z [Contributor]; Elliott, R. O [Contributor]; Fiermans, L [Contributor]; Fröhlich, F [Contributor]; Goel, Malti [Contributor]; [...]

    Physica status solidi : Volume 6, Number 1: July 16 - [Reprint 2021]

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    Berlin; Boston: De Gruyter, [2022] ; [Online-Ausgabe]

    Published in: Physica status solidi ; Volume 6, Number 1 ; A

  17. Wolfenstine, J.; Kohlstedt, D. L.

    Creep of (Mg, Fe)O single crystals

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    Springer Science and Business Media LLC, 1988

    Published in: Journal of Materials Science, 23 (1988) 10, Seite 3550-3557