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  1. Ishida, Takeshi; Tega, Naoki; Mori, Yuki; Miki, Hiroshi; Mine, Toshiyuki; Kume, Hitoshi; Torii, Kazuyoshi; Yamada, Ren-ichi; Shiraishi, Kenji

    State Transition of a Defect Causing Random-Telegraph-Noise Fluctuation in Stress-Induced Leakage Current of Thin SiO2 Films in a Metal–Oxide–Silicon Structure

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    IOP Publishing, 2013

    Published in: Japanese Journal of Applied Physics