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Rost, Rudolf [Author]

Silicium als Halbleiter : Mit 502 Bildern

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Stuttgart: Berliner Union, 1966
Ravi, K. V. [Author] ; Vysockoj, V. V. [Other]; Gorina, S. N. [Other]

Defekty i primesi v poluprovodnikovom kremnii

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Moskva: "Mir", 1984
Rein, Stefan [Author]

Lifetime spectroscopy : a method of defect characterization in silicon for photovoltaic applications ; with 29 tables

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Berlin; Heidelberg; New York: Springer, [2005]

Published in: Springer series in materials science ; 85
Siffert, Paul [Editor]; Krimmel, Eberhard F. [Editor]

Silicon : evolution and future of a technology ; with 21 tables

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Berlin; Heidelberg [u.a.]: Springer, 2004
Scheer, Hella [Author]

Modellrechnungen und Messmethoden zur Charakterisierung und Erfassung der wichtigsten Halbleiterparameter von monokristallinen Si-Solarzellen

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1982
Runyan, Walter R. [Author]

Silicon semiconductor technology

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New York [u.a.]: McGraw-Hill, 1965

Published in: Texas Instruments electronics series
Rönnebeck, Silke [Author]

Untersuchungen zur Anwendung makroporösen Siliziums in der Röntgentechnik

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2001
Nalwa, Hari Singh [Editor]

Silicon based materials and devices

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San Diego [u.a.]: Academic Press, 19XX-
Steger, Michael [Author]

Transition-metal defects in silicon : new insights from photoluminescence studies of highly enriched 28Si

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Heidelberg [u.a.]: Springer, 2013

Published in: Springer theses
Wirbeleit, Frank [Author]

The atomic structure of point defects in semiconductors by improved EPR, ENDOR data analysis - [2. Aufl.]

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Dresden: Büro-Frank, 2010
Buhrdorf, Andreas [Author]

Kapazitive mikromechanische 1D- und 2D-Ultraschallwandlerarrays für bildverarbeitende Systeme

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Berlin: Logos Verl., 2005
Bartels, Jörn [Author]

Fremdatome in Silizium-Kavitäten untersucht mit der gestörten Winkelkorrelation

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2002
Markmann, Markus Oliver [Author]

Optische Eigenschaften von Erbium in Si/Si 1-x C x , Si/Si 1-x Ge x und Si/SiO x Heterostrukturen - [1. Aufl.]

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München: Walter-Schottky-Inst., 2001

Published in: Selected topics of semiconductor physics and technology ; 41
Huff, Howard R. [Editor] ; Electrochemical Society Electronics Division, International Symposium on Silicon Materials Science and Technology 7 1994 San Francisco, Calif

Semiconductor silicon 1994 : proceedings of the Sixth International Symposium on Silicon Materials Science and Technology; [held 23 - 27 May 1994 in San Francisco]

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Pennington, NJ: The Electrochemical Society, 1994

Published in: Electrochemical Society: Proceedings volume ; 94,10
Trost, Diane [Author]

Rechnergestützte Überwachung des Innendurchmesser-Trennschleifprozesses - [Als Ms. gedr.]

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Düsseldorf: VDI-Verl., 1991

Published in: Verein Deutscher Ingenieure: Fortschritt-Berichte VDI ; 22400
Meeh, Peter [Author]

Photoelektrochemische Untersuchungen an P-Silizium-Halbleitern in flüssigem Ammoniak

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1990
Ahrens, Carsten [Author]

Untersuchung der Stabilität von Cu-Diffusionsbarrieren mit Hilfe von Schottky-Dioden

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Aachen: Shaker, 2003

Published in: Berichte aus der Halbleitertechnik
Erlebach, Axel [Author]

Modellierung und Simulation strahlensensitiver Halbleiterbauelemente - [Als Ms. gedr.]

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Aachen: Shaker, 1999

Published in: Berichte aus der Elektrotechnik
Chen, Peixuan [Author]

Thermal transport through SiGe superlattices

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Chemnitz: Universitätsverlag Chemnitz, 2015
Peng, Xiaogang [Editor]; Mingos, David M. P. [Other]; Bard, Allan J. [Other]; Bard, Allen J. [Other]

Semiconductor nanocrystals and silicate nanoparticles

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Berlin; Heidelberg [u.a.]: Springer, 2005

Published in: Structure and bonding ; 118

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