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  1. Elser, Benedikt [Author]; Kulko, Roman-David [Author] ; Technische Hochschule Deggendorf Technologie Campus Freyung

    FreshAnalytics : Schlussbericht

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    [Freyung-Grafenau]: [Technische Hochschule Deggendorf, Technologie Campus Grafenau], 28.03.2022

  2. Elser, Benedikt [Author] ; Fuhrmann, Thomas [Degree supervisor]; Carle, Georg [Degree supervisor]; Shavitt, Yuval [Degree supervisor]

    Latency Prediction for P2P Overlays

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    München: Universitätsbibliothek der TU München, 2012

    Published in: Network architectures and services ; 2012,05,1

  3. Vittadini, Andrea; Schirmer, Michael; Walz, Marie-Madeleine; Vollnhals, Florian; Lukasczyk, Thomas; Steinrück, Hans-Peter; Marbach, Hubertus; Riss, Alexander; Elser, Michael J.; Schürer, Benedikt; Diwald, Oliver

    Defects in Oxygen-Depleted Titanate Nanostructures

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    American Chemical Society (ACS), 2012

    Published in: Langmuir, 28 (2012) 20, Seite 7851-7858

  4. Munke, Anna; Andreasson, Jakob; Aquila, Andrew; Awel, Salah; Ayyer, Kartik; Barty, Anton; Bean, Richard J.; Berntsen, Peter; Bielecki, Johan; Boutet, Sébastien; Bucher, Maximilian; Chapman, Henry N.; Daurer, Benedikt J.; DeMirci, Hasan; Elser, Veit; Fromme, Petra; Hajdu, Janos; Hantke, Max F.; Higashiura, Akifumi; Hogue, Brenda G.; Hosseinizadeh, Ahmad; Kim, Yoonhee; Kirian, Richard A.; Reddy, Hemanth K.N.; [...]

    Coherent diffraction of single Rice Dwarf virus particles using hard X-rays at the Linac Coherent Light Source

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    Springer Science and Business Media LLC, 2016

    Published in: Scientific Data, 3 (2016) 1

  5. Park, Hyung Joo; Loh, N. Duane; Sierra, Raymond G.; Hampton, Christina Y.; Starodub, Dmitri; Martin, Andrew V.; Barty, Anton; Aquila, Andrew; Schulz, Joachim; Steinbrener, Jan; Shoeman, Robert L.; Lomb, Lukas; Kassemeyer, Stephan; Bostedt, Christoph; Bozek, John; Epp, Sascha W.; Erk, Benjamin; Hartmann, Robert; Rolles, Daniel; Rudenko, Artem; Rudek, Benedikt; Foucar, Lutz; Kimmel, Nils; Weidenspointner, Georg; [...]

    Toward unsupervised single-shot diffractive imaging of heterogeneous particles using X-ray free-electron lasers

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    The Optical Society, 2013

    Published in: Optics Express, 21 (2013) 23, Seite 28729

  6. Barty, Anton; Caleman, Carl; Aquila, Andrew; Timneanu, Nicusor; Lomb, Lukas; White, Thomas A.; Andreasson, Jakob; Arnlund, David; Bajt, Saša; Barends, Thomas R. M.; Barthelmess, Miriam; Bogan, Michael J.; Bostedt, Christoph; Bozek, John D.; Coffee, Ryan; Coppola, Nicola; Davidsson, Jan; DePonte, Daniel P.; Doak, R. Bruce; Ekeberg, Tomas; Elser, Veit; Epp, Sascha W.; Erk, Benjamin; Fleckenstein, Holger; [...]

    Self-terminating diffraction gates femtosecond X-ray nanocrystallography measurements

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    Springer Science and Business Media LLC, 2012

    Published in: Nature Photonics, 6 (2012) 1, Seite 35-40

  7. Aquila, Andrew; Hunter, Mark S.; Doak, R. Bruce; Kirian, Richard A.; Fromme, Petra; White, Thomas A.; Andreasson, Jakob; Arnlund, David; Bajt, Saša; Barends, Thomas R. M.; Barthelmess, Miriam; Bogan, Michael J.; Bostedt, Christoph; Bottin, Hervé; Bozek, John D.; Caleman, Carl; Coppola, Nicola; Davidsson, Jan; DePonte, Daniel P.; Elser, Veit; Epp, Sascha W.; Erk, Benjamin; Fleckenstein, Holger; Foucar, Lutz; [...]

    Time-resolved protein nanocrystallography using an X-ray free-electron laser

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    The Optical Society, 2012

    Published in: Optics Express, 20 (2012) 3, Seite 2706