Skip to contents Kanekawa, Nobuyasu [Author]; Ibe, Eishi H. [Author]; Suga, Takashi [Author] ; Uematsu, Yutaka [Other] Dependability in electronic systems : mitigation of hardware failures, soft errors, and electro-magnetic disturbances Books Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. New York, NY [u.a.]: Springer New York, 2011
Kanekawa, Nobuyasu [Author]; Ibe, Eishi H. [Author]; Suga, Takashi [Author] ; Uematsu, Yutaka [Other] Dependability in electronic systems : mitigation of hardware failures, soft errors, and electro-magnetic disturbances Books Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. New York, NY [u.a.]: Springer New York, 2011
> Subject Skip to next facet Physics (1) Wert ausschließen Technology (1) Wert ausschließen Show more show less
> Creator Skip to next facet Ibe, Eishi H. (1) Wert ausschließen Kanekawa, Nobuyasu (1) Wert ausschließen Suga, Takashi (1) Wert ausschließen Uematsu, Yutaka (1) Wert ausschließen Show more show less