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  16. Tang, Xiaohui; Reckinger, Nicolas; Poncelet, Olivier; Louette, Pierre; Ureña, Ferran; Idrissi, Hosni; Turner, Stuart; Cabosart, Damien; Colomer, Jean-François; Raskin, Jean-Pierre; Hackens, Benoit; Francis, Laurent A.

    Damage evaluation in graphene underlying atomic layer deposition dielectrics

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    Springer Science and Business Media LLC, 2015

    Published in: Scientific Reports