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  1. Breuer, Kenneth S. [Editor]

    Microscale diagnostic techniques

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    Berlin; Heidelberg [u.a.]: Springer, 2005

  2. Christiansen, Hanna [Editor]; Hirsch, Oliver [Editor]; Abdel-Hamid, Mona [Editor]; Kis, Bernhard [Editor]; Conners, C. Keith [Other]; Erhardt, Drew [Other]; Sparrow, Elizabeth P. [Other]

    Conners Skalen zu Aufmerksamkeit und Verhalten für Erwachsene : CAARS ; deutschsprachige Adaptation der Conners' adult ADHD rating scales (CAARS) von C. Keith Conners, Drew Erhardt und Elizabeth Sparrow ; Manual

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    Bern: Verlag Hans Huber, Hogrefe AG, 2014

  3. Flanagan, Dawn P. [Author]; Kaufman, Alan S. [Author]

    Essentials of WISC-IV assessment - [2. ed.]

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    Hoboken, NJ: Wiley, 2009

    Published in: Essentials of psychological assessment series

  4. Tan, Chuan Seng [Editor]; Gutmann, Ronald J. [Editor]; Reif, L. Rafael [Editor]

    Wafer level 3-D ICs process technology

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    New York, NY: Springer, 2008

    Published in: Series on integrated circuits and systems

  5. Meixner, Alfred J. [Editor]; Fleischer, Monika [Editor]; Kern, Dieter P. [Editor]; Höppener, Christiana [Editor]; Mackowski, Sebastian [Editor]; Adam, Pierre-Michel [Editor]; Rodriguez, Raul D. [Editor]; Gucciardi, Pietro G. [Editor]; Sheremet, Evgeniya [Editor]; McMillan, Norman [Editor] ; Walter de Gruyter GmbH & Co. KG

    Optical nanospectroscopy

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    Berlin; Boston: De Gruyter, [2023]