Skip to contents

Voelkel, Lutz [Author]; Pliquett, Jürgen [Author]

Signaturanalyse : theoret. Grundlagen u. Probleme ; Ausblick u. Anwendungen

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Berlin: Akademie-Verl., 1988

Published in: Informatik, Kybernetik, Rechentechnik ; 20
Ströle, Albrecht P. [Author]

Testablaufplanung und Testauswertung für selbsttestbare Schaltungen - [Als Ms. gedr.]

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Düsseldorf: VDI-Verl., 1992

Published in: Verein Deutscher Ingenieure: Fortschritt-Berichte VDI ; 220
Leisengang, Detlev [Author]

Klassifikation und Einsatz von Signaturregistern zur Fehlererkennung in digitalen Schaltungen

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

1983
Braun, Simon [Other]

Mechanical signature analysis : theory and applications

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

London [u.a.]: Academic Press, 1986
Zhang, David [Editor]; Jain, Anil K. [Other] ; ICBA 1 2004 Hongkong

Biometric authentication : first international conference, ICBA 2004, Hong Kong, China, July 15 - 17, 2004 ; proceedings

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Berlin; Heidelberg: Springer, 2004

Published in: Lecture notes in computer science ; 3072
Frühauf, Uwe [Other]

Zur Applikation der parallelen Signaturanalyse zur Prüfung von ADU- u. DAU-Baugruppen - [Als Ms. gedr.]

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Dresden: Techn. Univ., 1990

Published in: Technische Universität Dresden: Informationen / 09 ; 1990,3
Wunderlich, Hans-Joachim [Author]; Ströle, Albrecht P. [Author]

Maximizing the fault coverage in complex circuits by minimal number of signatures

View online
Schließen

Access

More information on the full text

Show more show less

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

1991 ; Online-Ausg.: Stuttgart: Universitätsbibliothek der Universität Stuttgart, 2012
Ströle, Albrecht P. [Author]; Wunderlich, Hans-Joachim [Author]

TESTCHIP: a chip for weighted random pattern generation, evaluation, and test control

View online
Schließen

Access

More information on the full text

Show more show less

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

1991 ; Online-Ausg.: Stuttgart: Universitätsbibliothek der Universität Stuttgart, 2012
Ströle, Albrecht P. [Author]; Wunderlich, Hans-Joachim [Author]

Error masking in self-testable circuits

View online
Schließen

Access

More information on the full text

Show more show less

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

1990 ; Online-Ausg.: Stuttgart: Universitätsbibliothek der Universität Stuttgart, 2012
Ströle, Albrecht P. [Author]; Wunderlich, Hans-Joachim [Author]; Haberl, Oliver [Author]

TESTCHIP: a chip for weighted random pattern generation, evaluation, and test control

View online
Schließen

Access

More information on the full text

Show more show less

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

1990 ; Online-Ausg.: Stuttgart: Universitätsbibliothek der Universität Stuttgart, 2012
Kesel, Frank [Author]; Wunderlich, Hans-Joachim [Author]

Automatische Synthese selbsttestbarer Moduln für hochkomplexe Schaltungen

View online
Schließen

Access

More information on the full text

Show more show less

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

1989 ; Online-Ausg.: Stuttgart: Universitätsbibliothek der Universität Stuttgart, 2012
Ranney, Kenneth I. [Editor] ; Radar Sensor Technology Veranstaltung 2015 Baltimore, Md, SPIE, SPIE, Active and Passive Signatures Veranstaltung 2015 Baltimore, Md

Radar Sensor Technology XIX, and Active and Passive Signatures VI : 20-23 April 2015, Baltimore, Maryland, United States

View online
Schließen

Access

https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/9461.toc

Show more show less

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Bellingham, Washington, USA: SPIE, [2015]

Published in: SPIE: Proceedings of SPIE ; 9461
Zhang, David [Author] ; Jain, Anil K. [Other]

Biometric Authentication : First International Conference, ICBA 2004, Hong Kong, China, July 15-17, 2004. Proceedings

View online
Schließen

Access

Full access (via DOI)

Show more show less

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Berlin; Heidelberg: Springer, 2004

Published in: Lecture notes in computer science ; 307200
Katschan, Igor [Author]; Mikitiuk, Viatcheslav [Author]; Ströle, Albrecht [Author]; Yarmolik, Viatcheslav [Author]

Berechnung der exakten Fehlererfassung beim Test mit Signaturanalyse

View online
Schließen

Links

https://publikationen.bibliothek.kit.edu/31594

Show more show less

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

KITopen (Karlsruhe Institute of Technologie), 2008-01-16

You did not find what you were looking for?

Purchase suggestion
Are you missing something you need for your research? If you have any suggestions please share them here.

Interlibrary Loan
Please search and order your favorite title in the Interlibrary Loan Portal.

Search in field:

Recently searched for:

You did not find what you were looking for?

> Year of publication

Year of publication