@misc
{TN_libero_mab2,
author = {
Di Gilio, Thierry
},
title = {
Reliability Study of 130nm CMOS technology submitted to hot carrier injections ; Etude de la fiabilité porteurs chauds et des performances des technologies CMOS 0.13 μm - 2nm
},
publisher = {HAL CCSD},
year = {2006},
address = {
[Erscheinungsort nicht ermittelbar]
},
url = {
http://slubdd.de/katalog?TN_libero_mab2
}
}