@book
{TN_libero_mab2,
author = {
Nakamura, Takashi
},
title = {
Terrestrial neutron-induced soft errors in advanced memory devices
},
publisher = {World Scientific},
isbn = {9812778810},
isbn = {9789812778819},
keywords = {
Semiconductor storage devices
,
Soft errors (Computer science)
,
Neutron irradiation
,
Radiation dosimetry
,
Nuclear physics
},
year = {2008},
abstract = {IntroductionTerrestrial neutron spectrometry and dosimetry -- Irradiation testing in the terrestrial field -- Neutron irradiation test facilities -- Review and discussion of experimental data -- Monte Carlo simulation methods -- Simulation results and their implications -- International standardization of the neutron test method -- Summary and challenges.},
abstract = {Literaturangaben},
address = {
New Jersey [u.a.]
},
url = {
http://slubdd.de/katalog?TN_libero_mab2
}
}