author = { IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems 29. 2016 Storrs, Conn AND Institute of Electrical and Electronics Engineers AND IEEE Computer Society AND IEEE Computer Society Test Technology Technical Council AND IEEE Computer Society Technical Committee on Dependable Computing and Fault Tolerance },

title = { 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) September 19-20, 2016, University of Connecticut, Storrs, CT USA },

publisher = {IEEE},

isbn = {1509036237},

isbn = {9781509036233},

keywords = { Integrated circuits Fault tolerance Congresses , Integrated circuits Very large scale integration Congresses , Nanotechnology Congresses , Konferenzschrift , VLSI , Fehlertoleranz },

year = {2016},

abstract = {Literaturangaben},

abstract = {Enthält Beiträge der zwei Special Sessions "Special Session on Fault-tolerant Realtime Systems" und "Special Session on the use of VLSI Techniques for Securing ICs against Attacks"},

address = { Piscataway, NJ },

url = { http://slubdd.de/katalog?TN_libero_mab2 }