author = { Wiefels, Stefan AND Von Witzleben, Moritz AND Huttemann, Michael AND Bottger, Ulrich AND Waser, Rainer AND Menzel, Stephan },

title = { Impact of the Ohmic Electrode on the Endurance of Oxide-Based Resistive Switching Memory },

publisher = {IEEE},

isbn = {1557-9646},

isbn = {0197-6370},

isbn = {0018-9383},

isbn = {2379-8653},

isbn = {2379-8661},

isbn = {0096-2430},

year = {2021},

abstract = {Diese Datenquelle enthält auch Bestandsnachweise, die nicht zu einem Volltext führen.},

booktitle = {IEEE transactions on electron devices 68(3), 1024 - 1030 (2021). doi:10.1109/TED.2021.3049765},

url = { http://slubdd.de/katalog?TN_libero_mab2 }