author = { Anjum, Taseer Gutt, Christian },

title = { Nanomechanics: Mechanical response analysis of semiconductor GaAs nanowires by using finite element method and x-ray diffraction techniques },

publisher = {Universitätsbibliothek der Universität Siegen},

keywords = { Diffraction , Nanowires , Finite element method , Nanodraht , Semiconductor nanowires , Manomechanical properties , X-ray diffraction , Gorsky effect , Three point bending test },

year = {2021},

address = { Siegen },

url = { http://slubdd.de/katalog?TN_libero_mab2 }