author = { Doering, Stefan AND Wachowiak, Andre AND Roetz, Hagen AND Eckl, Stefan AND Mikolajick, Thomas },

title = { SDVSRM - a new SSRM based technique featuring dynamically adjusted, scanner synchronized sample voltages for measurement of actively operated devices },

publisher = {Elsevier},

keywords = { SSRM based two pass atomic force microscopy (AFM) , SSRM-basierte Rasterkraftmikroskopie (AFM) , scanning dynamic voltage spreading resistance microscopy (SDVSRM) , Scanning Dynamic Voltage Spreading Resistance Microscopy (SDVSRM) , Scanning-Spreading-Resistance-Mikroskopie (SSRM) , Scanning spreading resistance microscopy (SSRM) },

year = {2022-10-11},

address = { Amsterdam , Dresden },

url = { http://slubdd.de/katalog?TN_libero_mab2 }