author = { Niehuis, Ewald AND Moellers, Rudolf AND Kollmer, Felix AND Arlinghaus, Henrik AND Bernard, Laetita AND Josef Hug, Hans AND Vranjkovic, Sasa AND Dianoux, Raphaelle AND Scheidemann, Adi },

title = { In-Situ TOF-SIMS and SFM Measurements Providing True 3D Chemical Characterization of Inorganic and Organic Nanostructures },

publisher = {Oxford University Press (OUP)},

isbn = {1431-9276},

isbn = {1435-8115},

keywords = { Instrumentation },

year = {2014},

url = { http://slubdd.de/katalog?TN_libero_mab2 }