author = { Luo, Dan AND Chen, Minyou AND Lai, Wei AND Xia, Hongjian AND Li, Hanrui AND Yu, Kai },

title = { A Fault Detection Method for Partial Chip Failure in Multichip IGBT Modules Based on Turn-Off Delay Time },

publisher = {Institute of Electrical and Electronics Engineers (IEEE)},

isbn = {0018-9383},

isbn = {1557-9646},

keywords = { Electrical and Electronic Engineering , Electronic, Optical and Magnetic Materials },

year = {2022},

url = { http://slubdd.de/katalog?TN_libero_mab2 }