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  1. Gajewski, Herbert [Author]; Liero, Matthias [Author]; Nürnberg, Reiner [Author]; Stephan, Holger [Author]

    WIAS-TeSCA - Two-dimensional semi-conductor analysis package - [published Version]

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    Berlin : Weierstraß-Institut für Angewandte Analysis und Stochastik, 2016

    Published in: Technical report // Weierstraß-Institut für Angewandte Analysis und Stochastik, Volume 14, ISSN 1618-7776

  2. Frankeser, Sophia [Author] ; Lutz, Josef [Degree supervisor]; Lutz, Josef [Other]; Kaminski, Nando [Other]

    Monitoring of age-relevant parameters in an integrated inverter system for electrical drives based on SiC-BJTs

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    Chemnitz: Universitätsverlag der Technischen Universität Chemnitz; Chemnitz: Technische Universität Chemnitz, 2018

  3. Krishnaswami, Sumi; Agarwal, Anant; Richmond, James; Capell, Craig; Ryu, Sei Hyung; Palmour, John; Geil, Bruce; Katsis, Dimos; Scozzie, Charles J.

    Silicon Carbide and Related Materials 2005: High Temperature Characterization of 4H-SiC Bipolar Junction Transistors

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    Trans Tech Publications Ltd., 2006

    Published in: Silicon Carbide and Related Materials 2005

  4. Zhang, Jian Hui; Wu, Jian; Alexandrov, Petre; Burke, Terry; Sheng, Kuang; Zhao, Jian H.

    Silicon Carbide and Related Materials 2005: 1836 V, 4.7 mΩ•cm2 High Power 4H-SiC Bipolar Junction Transistor

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    Trans Tech Publications Ltd., 2006

    Published in: Silicon Carbide and Related Materials 2005

  5. Suda, Jun; Nakano, Yuki; Shimada, Syouta; Amari, Koichi; Kimoto, Tsunenobu

    Silicon Carbide and Related Materials 2005: Electron Injection from GaN to SiC and Fabrication of GaN/SiC Heterojunction Bipolar Transistors

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    Trans Tech Publications Ltd., 2006

    Published in: Silicon Carbide and Related Materials 2005