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  1. Azzam, Rasheed M. [Author]; Azzam, Rasheed Mohammed Abdel-Goward [Author]; Bashara, N. M. [Author] ; Bashara, Nicholas M. [Other]

    Ellipsometry and polarized light - [Repr., paperback ed]

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    Amsterdam [u.a.]: North-Holland, 1987

    Published in: North-Holland personal library

  2. Wenisch, R. [Author]; Lungwitz, F. [Author]; Hanf, D. [Author]; Heller, R. [Author]; Zscharschuch, J. [Author]; Hübner, R. [Author]; von Borany, J. [Author]; Abrasonis, G. [Author]; Gemming, S. [Author]; Escobar-Galindo, R. [Author]; Krause, M. [Author]

    Cluster tool for in situ processing and comprehensive characterization of thin films at high temperatures

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    [2019]

    Published in: Analytical Chemistry ; 90 (2018), Seite 7837-7842

  3. Lee, J.H. [Author]; Ke, X. [Author]; Podraza, N.J. [Author]; Kourkoutis, L.F. [Author]; Heeg, T. [Author]; Fennie, C.J. [Author]; Schubert, J. [Author]; Muller, D.A. [Author]; Schiffer, P. [Author]; Schlom, D.G. [Author]

    Optical band gap and magnetic properties of unstrained EuTiO3 films

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    American Institute of Physics, 2009

    Published in: Applied physics letters 94, 212509 (2009). doi:10.1063/1.3133351