Published in: physica status solidi (a), 72 (1982) 1, Seite K73-K75

Published in: Solid-State Electronics, 25 (1982) 6, Seite 499-503

Published in: Radiation Effects, 61 (1982) 3-4, Seite 135-141

Published in: Radiation Effects, 67 (1982) 3, Seite 63-67

Published in: physica status solidi (b), 105 (1981) 1

Published in: Nuclear Instruments and Methods in Physics Research, 189 (1981) 2-3, Seite 589-598

Published in: Applied Physics Letters, 59 (1991) 22, Seite 2841-2843

Published in: IEEE Instrumentation & Measurement Magazine, 15 (2012) 1, Seite 16-21

Published in: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, 23 (2005) 5, Seite 2236-2239

Published in: Advanced Materials, 12 (2000) 21, Seite 1571-1580

Published in: Microelectronic Engineering, 25 (1994) 2-4, Seite 277-286

Published in: Journal of Materials Science: Materials in Electronics, 5 (1994) 1, Seite 1-12

Published in: Materials Chemistry and Physics, 32 (1992) 4, Seite 315-335

Published in: Journal of Applied Physics, 66 (1989) 2, Seite 663-665

Published in: Semiconductor Science and Technology, 6 (1991) 9, Seite 948-951

Published in: Applied Physics Letters, 56 (1990) 22, Seite 2186-2188

Published in: Journal of Applied Physics, 66 (1989) 10, Seite 5018-5025

Published in: Physica Status Solidi (a), 82 (1984) 1, Seite K101-K105

Published in: Journal of Applied Physics, 100 (2006) 6

Published in: Semiconductor Science and Technology, 11 (1996) 5, Seite 812-815