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  1. Colinge, Jean-Pierre [Editor]

    FinFETs and other multi-gate transistors

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    New York [u.a.]: Springer, 2008

    Published in: Series on integrated circuits and systems

  3. Baldauf, Tim [Author] ; Gerlach, Gerald [Degree supervisor]; Stenzel, Roland [Degree supervisor]

    Integration von Multi-Gate-Transistoren auf Basis einer 22 nm-Technologie

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    Dresden: Saechsische Landesbibliothek- Staats- und Universitaetsbibliothek Dresden; Dresden: Technische Universität Dresden, 2014

  10. Ritzenthaler, Romain [Author]

    Advanced architectures for FinFETs transistors – processing, device modelling and characterization. ; Architectures avancées des transistors FinFETs: Réalisation, caractérisation et modélisation

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    [Erscheinungsort nicht ermittelbar]: HAL CCSD, 2006

  12. Medeiros, G. C. [Author]; Fieback, M. [Author]; Santos Copetti, Thiago [Author]; Gebregiorgis, A. [Author]; Taouil, M. [Author]; Bolzani Pöhls, Letícia [Author]; Hamdioui, S. [Author]

    Improving the Detection of Undefined State Faults in FinFET SRAMs

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    Aachen: Universitätsbibliothek der RWTH Aachen, 2021

  15. Lackmann Zimpeck, Alexandra [Author]

    Circuit-level approaches to mitigate the process variability and soft errors in FinFET logic cells ; Approches au niveau du circuit pour atténuer la variabilité de fabrication et les soft errors dans les cellules logiques FinFET

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    [Erscheinungsort nicht ermittelbar]: HAL CCSD, 2019

  16. Karel, Amit [Author]

    Comparative Study of FinFET and FDSOI Nanometric Technologies Based on Manufacturing Defect Testability ; Etude comparative des technologies nanométriques FinFET et FD-SOI au regard de la testabilité des défauts de fabrication

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    [Erscheinungsort nicht ermittelbar]: HAL CCSD, 2017

  17. Ramkaj, Athanasios T. [Author]; Pelgrom, Marcel J.M [Author]; Steyaert, Michiel S. J. [Author]; Tavernier, Filip [Author]

    Multi-Gigahertz Nyquist Analog-to-Digital Converters : Architecture and Circuit Innovations in Deep-Scaled CMOS and FinFET Technologies - [1st ed. 2023.]

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    Cham: Springer International Publishing, 2023. ; Cham: Imprint: Springer, 2023.

    Published in: Analog Circuits and Signal Processing

  18. Breyer, Evelyn T. [Author]; Mulaosmanovic, Halid [Author]; Trommer, Jens [Author]; Melde, Thomas [Author]; Dünkel, Stefan [Author]; Trentzsch, Martin [Author]; Beyer, Sven [Author]; Mikolajick, Thomas [Author]; Slesazeck, Stefan [Author]

    Ultra-dense co-integration of FeFETs and CMOS logic enabling very-fine grained Logic-in-Memory

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    Dresden: Technische Universität Dresden, 2022