Skip to contents Gappisch, Steffen [Author] TCAD based development of a flash EPROM technology Microforms Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. 1996 ; Mikrofiche-Ausg. Müller-Gosewisch, Jan-Ole [Author] ; Müller, T. [Degree supervisor] Investigation of Radiation Damage in Silicon Sensors for the Phase-2 Upgrade of the CMS Outer Tracker Books View online Schließen > Access https://d-nb.info/1245450999/34 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Karlsruhe: KIT-Bibliothek, 2021 Kollmitzer, Michael [Author] Modeling of reverse current effects in trench-based smart power technologies - [published Version] Thesis View online Schließen > Links https://www.repo.uni-hannover.de/handle/123456789/9463 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Hannover : Institutionelles Repositorium der Leibniz Universität Hannover, 2020 Roll, Guntrade [Author] ; Frey, Lothar [Degree supervisor] Leakage Current and Defect Characterization of Short Channel MOSFETs Books View online Schließen > Access https://d-nb.info/1028392605/34 kostenfrei Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Erlangen: Universitätsbibliothek der Universität Erlangen-Nürnberg, 2012 Niemeier, Dennis [Author] ; Schröter, Michael [Degree supervisor]; Heinen, Stefan [Other]; Feick, Henning [Other] Device Simulation and Analytical Modeling of Weak Harmonic Distortion in Bulk Silicon Radio Frequency MOSFET Switches Books View online Schließen > Access https://d-nb.info/1233867792/34 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Dresden: Technische Universität Dresden, 2021 Palitschka, Florian [Author] ; Hansch, Walter [Degree supervisor]; Schwesinger, Norbert [Degree supervisor] Integration eines JFETs in einen Silizium Drift Detektor Books View online Schließen > Access https://d-nb.info/1071805142/34 kostenfrei Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Neubiberg: Universitätsbibliothek der Universität der Bundeswehr München, 2014 Kampen, Christian [Author] ; Ryssel, Heiner [Degree supervisor] Evaluation of CMOS Architectures Below 50 nm Gate Length by Numerical Simulations Books View online Schließen > Access https://d-nb.info/1056066261/34 kostenfrei Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Erlangen: Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), 2011 Grabinski, Wladek [Author] FOSS TCAD/EDA for Compact/SPICE Modeling Videos View online Schließen > Access Full access (via DOI) Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. [Erscheinungsort nicht ermittelbar]: FOSDEM VZW, 2016 Published in: FOSDEM 2015 ; (Jan. 2016) Fu, Yue [Author]; Li, Zhanming [Author]; Ng, Wai Tung [Author]; Sin, Johnny K. O. [Author] Integrated power devices and TCAD simulation Books View online Schließen > Access http://www.crcnetbase.com/doi/book/10.1201/b16396 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Boca Raton; London; New York: CRC Press ; Taylor & Francis Group, [2014] Published in: Devices, Circuits, and Systems Fu, Yue [Author]; Li, Zhanming [Author]; Ng, Wai Tung [Author]; Sin, Johnny K. O. [Author] Integrated power devices and TCAD simulation Books View online Schließen > Access https://learning.oreilly.com/library/view/-/9781466583832/?ar Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Boca Raton: CRC Press, [2014] Published in: Devices, circuits, and systems Baravelli, Emanuele [Author] TCAD approaches to multidimensional simulation of advanced semiconductor devices Books View online Schließen > Access http://amsdottorato.unibo.it/1124/ Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. [Erscheinungsort nicht ermittelbar]: Alma Mater Studiorum - Università di Bologna, 2008 Ewert, Tony [Author] Advanced TCAD Simulations and Characterization of Semiconductor Devices Books View online Schließen > Access http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-6883 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. [Erscheinungsort nicht ermittelbar]: Uppsala universitet, Fasta tillståndets elektronik; Uppsala : Acta Universitatis Upsaliensis, 2006 Meneses González, Annie [Author] ; Schöning, André [Degree supervisor] TCAD Simulations and Characterization of High-Voltage Monolithic Active Pixel Sensors Books View online Schließen > Access https://d-nb.info/1302557017/34 kostenfrei Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Heidelberg: Universitätsbibliothek Heidelberg, 2023 Al-Sa'Di, Mahmoud [Author] TCAD Based SiGe HBT Advanced Architecture Exploration ; Exploration d'architectures de transistors HBT SiGe à l'aide de l'outil TCAD Books View online Schließen > Access https://hal.archives-ouvertes.fr/tel-02457019 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. [Erscheinungsort nicht ermittelbar]: HAL CCSD, 2011 Meneses González, Annie [Author] ; Schöning, André [Degree supervisor] TCAD simulations and characterization of high-voltage monolithic active pixel sensors Books View online Schließen > Access Full access (via DOI) More information on the full text Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Heidelberg, 14 Sep. 2023 Ochoa Gómez, Mario [Author] TCAD Modelling, simulation and characterization of III-V multijunction solar cells Books View online Schließen > Access http://oa.upm.es/51571/ Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. [Erscheinungsort nicht ermittelbar]: E.T.S.I. Telecomunicación (UPM), 2018 Needleman, David Berney [Author]; Wagner, Hannes [Author]; Altermatt, Pietro P. [Author]; Buonassisi, Tonio [Author] Assessing the Device-performance Impacts of Structural Defects with TCAD Modeling Books View online Schließen > Access https://nbn-resolving.org/urn:nbn:de:101:1-2020071615430357480245 Full access (via DOI) Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Hannover: Gottfried Wilhelm Leibniz Universität Hannover, 2015 ; Hannover: Technische Informationsbibliothek (TIB), 2015 Published in: Energy Procedia ; 77 (2015), S. 8-14 Needleman, David Berney [Author]; Wagner, Hannes [Author]; Altermatt, Pietro P. [Author]; Buonassisi, Tonio [Author] Assessing the Device-performance Impacts of Structural Defects with TCAD Modeling - [published Version] Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Amsterdam : Elsevier, 2015 Published in: Energy Procedia 77 (2015) ; Energy Procedia IEEE Electron Devices Society Journal of technology computer aided design : TCAD ; a publication of the IEEE Electron Devices Society Journals / Newspapers / Series View online Schließen > Access https://ezb.ur.de/detail.phtml?bibid=SLUB&jour_id=197112 https://ezb.ur.de/detail.phtml?bibid=SLUB&jour_id=1290 https://ezb.ur.de/ReadMe?bibid=SLUB&owner=UNIEE&anchor=IELGERMANUNIV&lang=de https://ieeexplore.ieee.org/servlet/opac?punumber=6414144 https://ieeexplore.ieee.org/servlet/opac?punumber=6414145 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. [Erscheinungsort nicht ermittelbar]: Soc., 1996-2001 / Nachgewiesen 1996 - 2001; damit Ersch. eingest. D'Esposito, Rosario [Author] Electro-thermal characterization, TCAD simulations and compact modeling of advanced SiGe HBTs at device and circuit level ; Caractérisation électrothermique, simulations TCAD et modélisation compacte de transistors HBT en SiGe au niveau composant et circuit Books View online Schließen > Access https://tel.archives-ouvertes.fr/tel-01386487 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. [Erscheinungsort nicht ermittelbar]: HAL CCSD, 2016
Gappisch, Steffen [Author] TCAD based development of a flash EPROM technology Microforms Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. 1996 ; Mikrofiche-Ausg.
Müller-Gosewisch, Jan-Ole [Author] ; Müller, T. [Degree supervisor] Investigation of Radiation Damage in Silicon Sensors for the Phase-2 Upgrade of the CMS Outer Tracker Books View online Schließen > Access https://d-nb.info/1245450999/34 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Karlsruhe: KIT-Bibliothek, 2021
Kollmitzer, Michael [Author] Modeling of reverse current effects in trench-based smart power technologies - [published Version] Thesis View online Schließen > Links https://www.repo.uni-hannover.de/handle/123456789/9463 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Hannover : Institutionelles Repositorium der Leibniz Universität Hannover, 2020
Roll, Guntrade [Author] ; Frey, Lothar [Degree supervisor] Leakage Current and Defect Characterization of Short Channel MOSFETs Books View online Schließen > Access https://d-nb.info/1028392605/34 kostenfrei Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Erlangen: Universitätsbibliothek der Universität Erlangen-Nürnberg, 2012
Niemeier, Dennis [Author] ; Schröter, Michael [Degree supervisor]; Heinen, Stefan [Other]; Feick, Henning [Other] Device Simulation and Analytical Modeling of Weak Harmonic Distortion in Bulk Silicon Radio Frequency MOSFET Switches Books View online Schließen > Access https://d-nb.info/1233867792/34 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Dresden: Technische Universität Dresden, 2021
Palitschka, Florian [Author] ; Hansch, Walter [Degree supervisor]; Schwesinger, Norbert [Degree supervisor] Integration eines JFETs in einen Silizium Drift Detektor Books View online Schließen > Access https://d-nb.info/1071805142/34 kostenfrei Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Neubiberg: Universitätsbibliothek der Universität der Bundeswehr München, 2014
Kampen, Christian [Author] ; Ryssel, Heiner [Degree supervisor] Evaluation of CMOS Architectures Below 50 nm Gate Length by Numerical Simulations Books View online Schließen > Access https://d-nb.info/1056066261/34 kostenfrei Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Erlangen: Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), 2011
Grabinski, Wladek [Author] FOSS TCAD/EDA for Compact/SPICE Modeling Videos View online Schließen > Access Full access (via DOI) Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. [Erscheinungsort nicht ermittelbar]: FOSDEM VZW, 2016 Published in: FOSDEM 2015 ; (Jan. 2016)
Fu, Yue [Author]; Li, Zhanming [Author]; Ng, Wai Tung [Author]; Sin, Johnny K. O. [Author] Integrated power devices and TCAD simulation Books View online Schließen > Access http://www.crcnetbase.com/doi/book/10.1201/b16396 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Boca Raton; London; New York: CRC Press ; Taylor & Francis Group, [2014] Published in: Devices, Circuits, and Systems
Fu, Yue [Author]; Li, Zhanming [Author]; Ng, Wai Tung [Author]; Sin, Johnny K. O. [Author] Integrated power devices and TCAD simulation Books View online Schließen > Access https://learning.oreilly.com/library/view/-/9781466583832/?ar Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Boca Raton: CRC Press, [2014] Published in: Devices, circuits, and systems
Baravelli, Emanuele [Author] TCAD approaches to multidimensional simulation of advanced semiconductor devices Books View online Schließen > Access http://amsdottorato.unibo.it/1124/ Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. [Erscheinungsort nicht ermittelbar]: Alma Mater Studiorum - Università di Bologna, 2008
Ewert, Tony [Author] Advanced TCAD Simulations and Characterization of Semiconductor Devices Books View online Schließen > Access http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-6883 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. [Erscheinungsort nicht ermittelbar]: Uppsala universitet, Fasta tillståndets elektronik; Uppsala : Acta Universitatis Upsaliensis, 2006
Meneses González, Annie [Author] ; Schöning, André [Degree supervisor] TCAD Simulations and Characterization of High-Voltage Monolithic Active Pixel Sensors Books View online Schließen > Access https://d-nb.info/1302557017/34 kostenfrei Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Heidelberg: Universitätsbibliothek Heidelberg, 2023
Al-Sa'Di, Mahmoud [Author] TCAD Based SiGe HBT Advanced Architecture Exploration ; Exploration d'architectures de transistors HBT SiGe à l'aide de l'outil TCAD Books View online Schließen > Access https://hal.archives-ouvertes.fr/tel-02457019 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. [Erscheinungsort nicht ermittelbar]: HAL CCSD, 2011
Meneses González, Annie [Author] ; Schöning, André [Degree supervisor] TCAD simulations and characterization of high-voltage monolithic active pixel sensors Books View online Schließen > Access Full access (via DOI) More information on the full text Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Heidelberg, 14 Sep. 2023
Ochoa Gómez, Mario [Author] TCAD Modelling, simulation and characterization of III-V multijunction solar cells Books View online Schließen > Access http://oa.upm.es/51571/ Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. [Erscheinungsort nicht ermittelbar]: E.T.S.I. Telecomunicación (UPM), 2018
Needleman, David Berney [Author]; Wagner, Hannes [Author]; Altermatt, Pietro P. [Author]; Buonassisi, Tonio [Author] Assessing the Device-performance Impacts of Structural Defects with TCAD Modeling Books View online Schließen > Access https://nbn-resolving.org/urn:nbn:de:101:1-2020071615430357480245 Full access (via DOI) Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Hannover: Gottfried Wilhelm Leibniz Universität Hannover, 2015 ; Hannover: Technische Informationsbibliothek (TIB), 2015 Published in: Energy Procedia ; 77 (2015), S. 8-14
> Access https://nbn-resolving.org/urn:nbn:de:101:1-2020071615430357480245 Full access (via DOI) Show more show less
Needleman, David Berney [Author]; Wagner, Hannes [Author]; Altermatt, Pietro P. [Author]; Buonassisi, Tonio [Author] Assessing the Device-performance Impacts of Structural Defects with TCAD Modeling - [published Version] Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Amsterdam : Elsevier, 2015 Published in: Energy Procedia 77 (2015) ; Energy Procedia
IEEE Electron Devices Society Journal of technology computer aided design : TCAD ; a publication of the IEEE Electron Devices Society Journals / Newspapers / Series View online Schließen > Access https://ezb.ur.de/detail.phtml?bibid=SLUB&jour_id=197112 https://ezb.ur.de/detail.phtml?bibid=SLUB&jour_id=1290 https://ezb.ur.de/ReadMe?bibid=SLUB&owner=UNIEE&anchor=IELGERMANUNIV&lang=de https://ieeexplore.ieee.org/servlet/opac?punumber=6414144 https://ieeexplore.ieee.org/servlet/opac?punumber=6414145 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. [Erscheinungsort nicht ermittelbar]: Soc., 1996-2001 / Nachgewiesen 1996 - 2001; damit Ersch. eingest.
> Access https://ezb.ur.de/detail.phtml?bibid=SLUB&jour_id=197112 https://ezb.ur.de/detail.phtml?bibid=SLUB&jour_id=1290 https://ezb.ur.de/ReadMe?bibid=SLUB&owner=UNIEE&anchor=IELGERMANUNIV&lang=de https://ieeexplore.ieee.org/servlet/opac?punumber=6414144 https://ieeexplore.ieee.org/servlet/opac?punumber=6414145 Show more show less
D'Esposito, Rosario [Author] Electro-thermal characterization, TCAD simulations and compact modeling of advanced SiGe HBTs at device and circuit level ; Caractérisation électrothermique, simulations TCAD et modélisation compacte de transistors HBT en SiGe au niveau composant et circuit Books View online Schließen > Access https://tel.archives-ouvertes.fr/tel-01386487 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. [Erscheinungsort nicht ermittelbar]: HAL CCSD, 2016
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