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  1. Ezekiel, Shaoul [Editor]; Arditty, Hervé J. [Other] ; Massachusetts Institute of Technology, International Conference on Fiber Optic Rotation Sensors 1 1981 Cambridge, Mass

    Fiber-optic rotation sensors and related technologies : proceedings of the First International Conference, MIT, Cambridge, Mass., USA, November 9-11, 1981

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    Berlin; Heidelberg [u.a.]: Springer, 1982

    Published in: Springer series in optical sciences ; 32

  2. Jalas, Dirk [Author] ; Eich, Manfred [Degree supervisor]; Jacob, Arne [Degree supervisor] Technische Universität Hamburg, Technische Universität Hamburg Institut für Optische und Elektronische Materialien

    Nonreciprocal nanophotonic structures

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    Hamburg, 2019

  3. DKE Deutsche Kommission Elektrotechnik Elektronik Informationstechnik in DIN und VDE, German Commission for Electrical, Electronic and Information Technologies of DIN and VDE, DIN Deutsches Institut für Normung e. V., DIN German Institute for Standardization

    DIN EN 61300-2-35 : Lichtwellenleiter - Verbindungselemente und passive Bauteile - Grundlegende Prüf- und Messverfahren - Teil 2-35: Prüfungen - Kabelnutation (IEC 61300-2-35:2014); Deutsche Fassung EN 61300-2-35:2014 - [2015-01-00]

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    Berlin, Wien, Zürich: Beuth Verlag, 2015

    Published in: DIN-Regelwerk- Deutsche Normen

  4. Jacobsen, K. [Author]; Weinmann, M. [Author]; Jutzi, B. [Author]; Hinz, S. [Author]

    Systematic geometric image errors of very high resolution optical satellites - [published Version]

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    Göttingen : Copernicus GmbH, 2018

    Published in: ISPRS TC I Mid-term Symposium "Innovative Sensing – From Sensors to Methods and Applications" ; The International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences ; XLII-1

  5. Horn, H. [Author]; Müller, G.M. [Author]; Rasel, Ernst Maria [Author]; Santos, Luis [Author]; Hübner, Jens [Author]; Oestreich, Michael [Author]

    Spin-noise spectroscopy under resonant optical probing conditions: Coherent and nonlinear effects - [published Version]

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    College Park, MD : American Physical Society, 2011

    Published in: Physical Review A 84 (2011), Nr. 4

  6. DIN-Normenausschuss Feinmechanik und Optik (NAFuO), Optics and Precision Mechanics Standards Committee, DIN Deutsches Institut für Normung e. V., DIN German Institute for Standardization

    DIN ISO 8576 : Optik und optische Instrumente - Mikroskope - Bezugssysteme der Polarisationsmikroskopie (ISO 8576:1996) - [2002-06-00]

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    Berlin, Wien, Zürich: Beuth Verlag, 2002

    Published in: DIN-Regelwerk- Deutsche Normen

  7. ISO/TC 172 Optik und Photonik, ISO/TC 172 Optics and photonics, ISO/TC 172 Optique et photonique, ISO Internationale Organisation für Normung, ISO International Organization for Standardization, ISO Organisation Internationale de Normalisation

    ISO 8576 : Optics and optical instruments - Microscopes - Reference system of polarized light microscopy - [1996-12-00]

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    Geneve: International Organization for Standardization, 1996

    Published in: ISO-Regelwerk- ISO-Normen

  8. DIN-Normenausschuss Feinmechanik und Optik (NAFuO), Optics and Precision Mechanics Standards Committee, DIN Deutsches Institut für Normung e. V., DIN German Institute for Standardization

    DIN 58189 : Grundnormen der Optik - Bestimmung der Brennweite - [2020-04-00]

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    Berlin, Wien, Zürich: Beuth Verlag, 2020

    Published in: DIN-Regelwerk- Deutsche Normen

  9. ISO/IEC JTC 1/SC 23 Digitale optische Datenträger, ISO/IEC JTC 1/SC 23 Optical disk cartridges for information processing, ISO/CEI JTC 1/SC 23 Cartouches de disques optiques pour échange l'information, ISO Internationale Organisation für Normung, ISO International Organization for Standardization, ISO Organisation Internationale de Normalisation, IEC Internationale Elektrotechnische Kommission, IEC International Electrotechnical Commission, CEI Commission Electrotechnique Internationale

    ISO/IEC 25434 : Information technology - Data interchange on 120 mm and 80 mm optical disk using +R DL format - Capacity: 8,55 Gbytes and 2,66 Gbytes per side (recording speed up to 16X) - [2008-12-00]

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    Geneve: International Organization for Standardization, 2008

    Published in: ISO-Regelwerk- ISO-Normen