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Karlsruhe: KIT Scientific Publishing, 2022
Published in:Schriftenreihe Automatische Sichtprüfung und Bildverarbeitung ; 20
Maier, Georg
[Author];
Reith-Braun, Marcel
[Author];
Bauer, Albert
[Author];
Gruna, Robin
[Author];
Pfaff, Florian
[Author];
Kruggel-Emden, Harald
[Author];
Längle, Thomas
[Author];
Hanebeck, Uwe D.
[Author];
Beyerer, Jürgen
[Author]
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KIT Scientific Publishing, 2023-01-16
Kronenwett, Felix
[Author];
Klingenberg, Pia
[Author];
Maier, Georg
[Author];
Längle, Thomas
[Author];
Metzsch-Zilligen, Elke
[Author];
Beyerer, Jürgen
[Author]
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KIT Scientific Publishing, 2023-05-05
Published in:ISSN: 2510-7240
Maier, Georg
[Author];
Reith-Braun, Marcel
[Author];
Bauer, Albert
[Author];
Gruna, Robin
[Author];
Pfaff, Florian
[Author];
Kruggel-Emden, Harald
[Author];
Längle, Thomas
[Author];
Hanebeck, Uwe D.
[Author];
Beyerer, Jürgen
[Author]
Maier, Georg
[Author];
Pfaff, Florian
[Author];
Wagner, Matthias
[Author];
Pieper, Christoph
[Author];
Gruna, Robin
[Author];
Noack, Benjamin
[Author];
Kruggel-Emden, Harald
[Author];
Längle, Thomas
[Author];
Hanebeck, Uwe D.
[Author];
Wirtz, Siegmar
[Author];
Scherer, Viktor
[Author];
Beyerer, Jürgen
[Author]
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Aachen: Universitätsbibliothek der RWTH Aachen, 2022
Maier, Georg
[Author];
Pfaff, Florian
[Author];
Pieper, Christoph
[Author];
Gruna, Robin
[Author];
Noack, Benjamin
[Author];
Kruggel-Emden, Harald
[Author];
Längle, Thomas
[Author];
Hanebeck, Uwe D.
[Author];
Wirtz, Siegmar
[Author];
Scherer, Viktor
[Author];
Beyerer, Jürgen
[Author]
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Shaker Verlag, 2018-01-01
Maier, Georg
[Author];
Pfaff, Florian
[Author];
Becker, Florian
[Author];
Pieper, Christoph
[Author];
Gruna, Robin
[Author];
Noack, Benjamin
[Author];
Kruggel-Emden, Harald
[Author];
Längle, Thomas
[Author];
Hanebeck, Uwe D.
[Author];
Wirtz, Siegmar
[Author];
Scherer, Viktor
[Author];
Beyerer, Jürgen
[Author]
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De Gruyter, 2018-06-22
Published in:Technisches Messen, 85 (3), 202–210 ; ISSN: 0171-8096, 2196-7113
Maier, Georg
[Author];
Pfaff, Florian
[Author];
Pieper, Christoph
[Author];
Gruna, Robin
[Author];
Noack, Benjamin
[Author];
Kruggel-Emden, Harald
[Author];
Langle, Thomas
[Author];
Hanebeck, Uwe D.
[Author];
Wirtz, Siegmar
[Author];
Scherer, Viktor
[Author];
Beyerer, Jürgen
[Author]
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BAM-Publica - Publikationsserver der Bundesanstalt für Materialforschung und -prüfung (BAM), 2023
Maier, Georg
[Author];
Pfaff, Florian
[Author];
Bittner, Andrea
[Author];
Gruna, Robin
[Author];
Noack, Benjamin
[Author];
Kruggel-Emden, Harald
[Author];
Hanebeck, Uwe D.
[Author];
Längle, Thomas
[Author];
Beyerer, Jürgen
[Author]
Maier, Georg
[Author];
Pfaff, Florian
[Author];
Pieper, Christoph
[Author];
Gruna, Robin
[Author];
Noack, Benjamin
[Author];
Kruggel-Emden, Harald
[Author];
Längle, Thomas
[Author];
Hanebeck, Uwe D.
[Author];
Beyerer, Jürgen
[Author]