%0 Generic
%T Trap-assisted memristive switching in HfO2-based devices studied by in situ soft and hard X-ray photoelectron spectroscopy
%A Zahari, Finn
%A Marquardt, Richard
%A Kalläne, Matthias
%A Gronenberg, Ole
%A Schlueter, Christoph
%A Matveyev, Yury
%A Haberfehlner, Georg
%A Diekmann, Florian
%A Nierhauve, Alena
%A Buck, Jens
%A Hanff, Arndt
%A Kolhatkar, Gitanjali
%A Kothleitner, Gerald
%A Kienle, Lorenz
%A Ziegler, Martin
%A Carstensen, Jürgen
%A Roßnagel, Kai
%A Kohlstedt, Hermann
%@ 2199-160X
%D 2023
%U http://slubdd.de/katalog?TN_libero_mab2
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