%0 Generic
%T 25th IEEE VLSI Test Symposium, 2007 VTS 2007 ; 6 - 10 May 2007, Berkeley, California ; proceeedings
%A IEEE Computer Society Test Technology Technical Council
%I IEEE Computer Society
%@ 0769528120
%@ 9780769528120
%K Integrated circuits Very large scale integration Testing Congresses
%K Konferenzschrift
%K VLSI
%D 2007
%X "IEEE Computer Society Order Number P2812"--Title page verso
%X Includes bibliographical references and author index
%X Parallel als Buch-Ausg. erschienen
%C IEEE Computer Society
%C Los Alamitos, Calif. [u.a.]
%U http://slubdd.de/katalog?TN_libero_mab2
Download citation