%0 Generic
%T The 100th anniversary of the four-point probe technique: the role of probe geometries in isotropic and anisotropic systems
%A Miccoli, Ilio
%A Edler, Frederik
%A Pfnür, Herbert
%A Tegenkamp, Christoph
%7 published Version
%I IOP Publishing Ltd.
%@ 0953-8984
%K 4-probe resistances
%K van
%K electrodes
%K hall plate
%K conductivity measurements
%K square sample
%K electrical-resistivity
%K nanostructures
%K extension
%K four-point probe techniques
%K correction factor
%K semiconductor sheet resistivity
%K finite contacts
%K bulk and surface resistivity
%D 2015-06-10
%X Diese Datenquelle enthält auch Bestandsnachweise, die nicht zu einem Volltext führen.
%C IOP Publishing Ltd.
%C Bristol
%U http://slubdd.de/katalog?TN_libero_mab2
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