%0 Generic
%T Nano-Raman spectroscopy with metallized atomic force microscopy tips on strained silicon structures
%A Zhu, Liang
%A Georgi, Carsten
%A Hecker, Michael
%A Rinderknecht, Jochen
%A Mai, Andreas
%A Ritz, Yvonne
%A Zschech, Ehrenfried
%I AIP Publishing
%@ 0021-8979
%@ 1089-7550
%K General Physics and Astronomy
%D 2007
%C AIP Publishing
%U http://slubdd.de/katalog?TN_libero_mab2
Download citation