%0 Generic
%T In-Situ TOF-SIMS and SFM Measurements Providing True 3D Chemical Characterization of Inorganic and Organic Nanostructures
%A Niehuis, Ewald
%A Moellers, Rudolf
%A Kollmer, Felix
%A Arlinghaus, Henrik
%A Bernard, Laetita
%A Josef Hug, Hans
%A Vranjkovic, Sasa
%A Dianoux, Raphaelle
%A Scheidemann, Adi
%I Oxford University Press (OUP)
%@ 1431-9276
%@ 1435-8115
%K Instrumentation
%D 2014
%C Oxford University Press (OUP)
%U http://slubdd.de/katalog?TN_libero_mab2
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