%0
Generic
%T
‘Designer atoms’ for quantum metrology
%A Roos, C. F.
%A Chwalla, M.
%A Kim, K.
%A Riebe, M.
%A Blatt, R.
%I Springer Science and Business Media LLC
%@ 0028-0836
%@ 1476-4687
%D 2006
%C Springer Science and Business Media LLC
%U http://slubdd.de/katalog?TN_libero_mab2