%0
Generic
%T
Understanding metric-related pitfalls in image analysis validation
%A Reinke, Annika
%A Tizabi, Minu D.
%A Baumgartner, Michael
%A Eisenmann, Matthias
%A Heckmann-Nötzel, Doreen
%A Kavur, A. Emre
%A Rädsch, Tim
%A Sudre, Carole H.
%A Acion, Laura
%A Antonelli, Michela
%A Arbel, Tal
%A Bakas, Spyridon
%A Benis, Arriel
%A Buettner, Florian
%A Cardoso, M. Jorge
%A Cheplygina, Veronika
%A Chen, Jianxu
%A Christodoulou, Evangelia
%A Cimini, Beth A.
%A Farahani, Keyvan
%A Ferrer, Luciana
%A Galdran, Adrian
%A van Ginneken, Bram
%A Glocker, Ben
%A Godau, Patrick
%A Hashimoto, Daniel A.
%A Hoffman, Michael M.
%A Huisman, Merel
%A Isensee, Fabian
%A Jannin, Pierre
%A Kahn, Charles E.
%A Kainmueller, Dagmar
%A Kainz, Bernhard
%A Karargyris, Alexandros
%A Kleesiek, Jens
%A Kofler, Florian
%A Kooi, Thijs
%A Kopp-Schneider, Annette
%A Kozubek, Michal
%A Kreshuk, Anna
%A Kurc, Tahsin
%A Landman, Bennett A.
%A Litjens, Geert
%A Madani, Amin
%A Maier-Hein, Klaus
%A Martel, Anne L.
%A Meijering, Erik
%A Menze, Bjoern
%A Moons, Karel G. M.
%A Müller, Henning
%A Nichyporuk, Brennan
%A Nickel, Felix
%A Petersen, Jens
%A Rafelski, Susanne M.
%A Rajpoot, Nasir
%A Reyes, Mauricio
%A Riegler, Michael A.
%A Rieke, Nicola
%A Saez-Rodriguez, Julio
%A Sánchez, Clara I.
%A Shetty, Shravya
%A Summers, Ronald M.
%A Taha, Abdel A.
%A Tiulpin, Aleksei
%A Tsaftaris, Sotirios A.
%A Van Calster, Ben
%A Varoquaux, Gaël
%A Yaniv, Ziv R.
%A Jäger, Paul F.
%A Maier-Hein, Lena
%I Springer Science and Business Media LLC
%@ 1548-7091
%@ 1548-7105
%D 2024
%C Springer Science and Business Media LLC
%U http://slubdd.de/katalog?TN_libero_mab2